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C4 Measuring

Measurement Support Built In

Measurement Window

Included with VERIFY, CALIBRATE and BLEND Tools

Integrated directly into all three tools for quick access

Supports Instruments:

Allows full access to instrument capabilities including M0, M1, M2, M3 filtering, Reflective / Transmissive scans, Aperture Control and multiple measurements per patch (depending of instrument features, of course)

Scans targets created by:

MemoryScan function recalls position of prior targets for speedy multi-target scanning

Multi-page targets and target rotation also supported