Included with VERIFY, CALIBRATE and BLEND Tools
Integrated directly into all three tools for quick access
Supports Instruments:
Allows full access to instrument capabilities including M0, M1, M2, M3 filtering, Reflective / Transmissive scans, Aperture Control and multiple measurements per patch (depending of instrument features, of course)
Scans targets created by:
MemoryScan function recalls position of prior targets for speedy multi-target scanning
Multi-page targets and target rotation also supported